Applied Materials’ New eBeam Metrology System Paves the Way to High-NA EUV Lithography
Go back to Applied Materials’ New eBeam Metrology System Paves the Way to High-NA EUV Lithography| Applied Materials Inc (NASDAQ: AMAT) | Delayed: 381.59 -27.35 (6.69%) | |||||
|---|---|---|---|---|---|---|
| Previous Close | $408.94 | 52 Week High | $31.07 | |||
| Open | $383.32 | 52 Week Low | $15.44 | |||
| Day High | $389.82 | P/E | 1,004.18 | |||
| Day Low | $378.40 | EPS | $0.38 | |||
| Volume | 4,826,216 | |||||



