Applied Materials’ New eBeam Metrology System Paves the Way to High-NA EUV Lithography
Go back to Applied Materials’ New eBeam Metrology System Paves the Way to High-NA EUV Lithography| Applied Materials Inc (NASDAQ: AMAT) | Delayed: 558.32 +5.68 (1.03%) | |||||
|---|---|---|---|---|---|---|
| Previous Close | $552.64 | 52 Week High | $31.07 | |||
| Open | $548.62 | 52 Week Low | $15.44 | |||
| Day High | $560.56 | P/E | 1,469.26 | |||
| Day Low | $544.07 | EPS | $0.38 | |||
| Volume | 2,236,970 | |||||
