Teradyne launches Magnum E2 memory test system for AI workloads

Teradyne, Inc. (NASDAQ: TER) announced the Magnum E2, a memory test system designed for advanced DRAM and flash interfaces, including LPDDR6, DDR6, GDDR7, and NAND flash.

The system is built on Teradyne's Near-DUT Test architecture, the same foundation used in its Magnum EPIC platform. Magnum E2 supports both production and engineering configurations on a shared hardware and software platform, covering qualification through high-volume manufacturing.

Key features include support for NRZ, PAM3, and PAM4 signaling, a programmable architecture intended to accommodate current and future DRAM and NAND standards, and built-in logic test capability designed to allow customers to consolidate test operations. The system places digital instruments close to the device under test to maintain signal integrity.

"The memory inside an AI accelerator is as critical to system performance as the compute die itself, and the test requirements have never been more demanding," said Ben Han, president of the Memory Test division at Teradyne. "Magnum E2 was built to eliminate this trade-off and give leading memory manufacturers a platform they can qualify today and grow with for the future."

Teradyne plans to showcase the Magnum E2 at SEMICON West, booth #1143, October 13–15 in San Francisco, California.

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