Nanometrics (NANO) Reached 1,000 'Recipes' Algo Milestone for OCD Technology
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Nanometrics Incorporated (Nasdaq: NANO), announced a significant milestone marking the adoption of its optical critical dimension (OCD) technology. More than 1,000 “recipes,” algorithms to analyze and model critical structures, are now in production at semiconductor and data storage manufacturers around the world.
OCD technology allows manufacturers to make non-destructive measurements of film thickness, as well as the width, height, length, depth and pitch of structural features on both the surface of a layer and in previous process layers below the surface. The flexibility of OCD tools to provide all of these measurements, often simultaneously, has created a commanding position for the technology in process control metrology. Demand for OCD technology has increased as manufacturers reduce devices to smaller and smaller geometries, while adding many new process layers and steps at the same time.
OCD technology allows manufacturers to make non-destructive measurements of film thickness, as well as the width, height, length, depth and pitch of structural features on both the surface of a layer and in previous process layers below the surface. The flexibility of OCD tools to provide all of these measurements, often simultaneously, has created a commanding position for the technology in process control metrology. Demand for OCD technology has increased as manufacturers reduce devices to smaller and smaller geometries, while adding many new process layers and steps at the same time.
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