Teradyne, Inc. (NASDAQ: TER) announced the Iris 100, a production-ready optical test platform designed for microLED devices used in augmented reality microdisplays and optical data interconnects for AI data centers.

The system uses a spectrometer and high-resolution camera to measure spectral response, per-pixel luminance, and uniformity across arrays containing millions of individual emitters. It integrates with Teradyne's existing UltraFLEXplus platform for combined optical and electrical test, and uses the company's IG-XL software to detect defects such as dead or stuck pixels early in the manufacturing process. The system includes a NIST-traceable calibration workflow for absolute measurements across lots, wafers, and manufacturing sites.

Shannon Poulin, president of the Semiconductor Test division at Teradyne, said: "MicroLED is shifting from lab to volume production for both AR microdisplays and, increasingly, optical interconnects, which are becoming foundational to how AI data centers scale beyond copper. Both technologies demand per-emitter test at production throughput, and Iris 100 delivers that today on test infrastructure our customers already run at scale."

The Iris 100 follows Teradyne's introduction of its Photon 100 platform for silicon photonics and co-packaged optics test, and the 2025 acquisition of photonic test specialist Quantifi Photonics. The system supports both wafer and final test, with a stated roadmap to add photodetector test capabilities.