Nanometrics (NANO) Awarded Multi-System Order From Leading Semiconductor Foundry

November 2, 2009 4:14 PM EST

Nanometrics Incorporated (Nasdaq: NANO) announced a multi-system order from a leading semiconductor foundry for its Integrated Metrology (IM) and NanoCD(TM) suite solutions. The systems will be delivered in the fourth quarter of this year for optical critical dimension (OCD) metrology on 22nm gate etch applications.

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